Seminar Description – Digital storage oscilloscopes are powerful instruments that a huge percentage of scientists and test engineers use regularly. Waveform measurements are a fundamental oscilloscope feature that, if not used properly, can return inaccurate or misleading results. However, in the past, these instruments tended to be rather bulky and not easily integrated into an automated solution. Fortunately, technology has progressed to the point where the useful features of storage oscilloscopes are now available in the PXI form/factor.

Selecting the right measurement from a catalog of possibilities and accurately interpreting the results is essential to avoid confusion and mistakes. This seminar describes the subtle differences between many standard measurements, discusses measurement limitations due to accuracy and resolution, and provides typical applications to illustrate measurement usage. Ultimately, this information should help the user avoid common pitfalls in applying oscilloscope measurements.

The seminar will be presented by Creston Kuenzi, Applications Engineer for ZTEC Instruments. The event will be presented on Thursday, September 28th at 11:00 AM EDT. To register, please visit the PXISA web site at www.pxisa.org.