Newport Beach, CA - June 12, 2006 - Measurement Science Conference (MSC) Programs Chairman Mark Kaufman announced the Call for Papers for the 2007 Conference. This request for Technical Program submissions includes both technical papers and tutorial workshops. On the day prior to the Technical Program, MSC offers an extensive program of half-day/4-hour Tutorial Workshops. Participants are invited to submit a Tutorial Workshop proposal in addition to, or instead of, a conference paper. The submission deadline is June 30, 2006.
The 37th Annual Conference will be held at the Long Beach Convention Center, January 22-26, 2007. NIST Seminars are Monday and Tuesday; Tutorial Workshops are Wednesday; and the Technical Program is on Thursday and Friday.
Following a strong line-up of technical sessions at the 2006 Conference, next year's conference will continue to focus on the challenges facing metrology and calibration. Last year, more than a dozen technical sessions covered the current state of metrology (national and international), standards and practices, corporate process changes and the impact on the lab, and how lab managers can meet the coming challenges.
"In keeping with our 2007 conference theme of Apply Metrology . . . Rule the World, we're organizing a broad spectrum of presentations that cover the depth and breadth that metrology plays in nearly every aspect of our lives," said Kaufman. "MSC has always been an educational conference, with its valuable information coming fresh from those in the metrology field. By having these presenters and authors share their experiences and challenges in metrology with others, we are able to develop a technical program like no other."
Those interested in submitting for the Technical Program are encouraged to keep the following topics in mind and make their submissions to the respective Conference Committee members below:
Measurements
Electrical; pressure; resistance; capacitance; temperature; vibration; time; frequency; mass; gas and liquid flow; humidity; RF and microwave; air quality; optical, short wave light; transducers verification; chemical-biological; coordinate measuring machines; pharmaceutical; advanced technologies (NANO, etc.); and medical measurements.
Processes
Traceability; laboratory accreditation; laws and regulations; interval adjustment; procedures development; automation; technician training error and data analysis; pharmaceutical environments; outsourcing services; audits and quality control; equipment development; on-site calibration; reference standard maintenance; ISO and other written standards; hazardous materials handling; quality standards; and equipment management.
Authors and Session Developers
Contact: Mark Kaufman
Phone (866) 672-6327
programs@msc-conf.com
Tutorial Workshops
Contact: Arman Hovakemian
Phone: (866) 672-6327
tutorials@msc-conf.com
John Bowman
Phone (866) 672-6327
tutorials@msc-conf.com
Further updates on the Tutorial Workshop schedule, NIST Seminar schedule, Technical Paper presentations, and the other Conference events, can all be found by logging on to the website at www.msc-conf.com or calling tollfree 1-866-MSC-MEAS (1-866-672-6327).
# # # # #
For more than 35 years, the Measurement Science Conference has been a leader in promoting education and professionalism in the measurement science disciplines. The annual conference attracts expert speakers, exhibitors, and attendees from around the world for the weeklong event focused on the dynamic measurement science field.
