The road ahead: Unit Under Test
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By now, our regular readers may have heard that our magazine is changing direction. It's true, but it's not an "end to an era" as some folks have suggested. Let's set the record straight on why we're changing, and what our readers will see starting in 2008.
First, we’re not changing because PXI is dwindling – it’s not. PXI growth is still quite healthy. But the list of options test and measurement engineers and project managers need to consider is growing daily. PXI, LXI, VXI, test management software, JTAG, USB, Ethernet, RF technology, synthetic instruments, portable and handheld instruments, data acquisition, and other technologies important to test and measurement are gaining momentum across the board.
Second, while we see this proliferation of technology clearly, we’ve only been able to cover a small part of it with PXI as the prominent part of our title. Our title has actually hindered us in getting some of the information we’d like to have brought you regarding other important – but competitive to PXI – technology. If you look back on our recent coverage, and even articles in this issue, we’ve been pressing the envelope and including more non-PXI-based content.
Finally, we’ve been watching how other publications address the test and measurement space, and we think it’s time for a new approach. Besides the list of technology above, there are big issues like software integration testing that also merit coverage. And there are a growing range of applications that need their stories told.
We’ve listened to a lot of input – from our readers, our contributors, and our advertisers (without whom free subscriptions wouldn’t be possible). We used those ideas and our experience to create a new brand: Unit Under Test.
What readers will see first is a Unit Under Test department in Embedded Computing Design beginning with the January 2008 issue. This opens coverage to a broad range of topics and technology, and exposes ideas to a larger audience than was possible with PXI, Test and Technology. Coverage will be in both print and e-letter formats.
Additionally, we’re planning supplemental print issues of Unit Under Test on specific topics in 2008. The first one we’re looking at is Wireless Test Systems, which is a very hot topic for our readers. We’ll feature more ideas like the WiMAX testing technology described by Anritsu on page 8 of this issue, with commentary from leading companies about the latest technology and applications.
We’re also discussing e-cast topics with potential sponsors on Unit Under Test topics, and will have announcements on any events as topics and presenters firm up.
In summary, we’ll be here to serve our readers:
- We’ll convert your PXI, Test and Technology subscription to a Unit Under Test subscription, so you’ll receive any supplemental print issues sent in the future.
- If you’d like to follow the new Unit Under Test coverage in Embedded Computing Design but don’t yet subscribe to that, we’ll need your permission to send you issues. You can visit the Subscriptions page at www.opensystems-publishing.com/subscriptions and check the Embedded Computing Design box.
We welcome your ideas on how Unit Under Test can best serve your needs, and we appreciate the opportunity to serve your needs for test and measurement information.
Sincerely,
Don Dingee
Contributing Editor, Embedded Computing Design
