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Recently published:

WiMAX   Winter 2007
Evaluating WiMAX signal quality
By Daljeet Singh, Anritsu
Setting up an effective WiMAX test requires an understanding of the critical parameters and application of advanced strategies and test equipment.
PXI   Winter 2007
3U PXI packs a punch
By Staff, OpenSystems Publishing
3U PXI lends itself to small systems where rack space is limited or portability is desired.
Automated Test Systems   Winter 2007
An off-the-shelf test software platform for integrating multiple technologies
By Mike Dewey and Ron Yazma, Geotest
ATE systems are rarely all one flavor – they typically have a range of hardware and software technologies, and new technologies continue to be added all the time.
RF Test   Winter 2007
PXI gets serious for RF and optical test
By Staff, OpenSystems Publishing
Improved isolation and shielding techniques have led to a leap in RF technology on PXI formats.
Medical applications   Winter 2007
Developments in data acquisition aid in earlier cancer detection
By Staff, OpenSystems Publishing
A PET scanner system using a PCI digitizer effectively captures and measures data to produce precise 3D images of functional processes of the body.
RF Test   Winter 2007
Big system for big test
By Don Dingee, OpenSystems Publishing
Some complex testing requirements call for big systems to perform all the required at-speed testing.
PXI   
Celebrating milestones
By Bob Stasonis, OpenSystems Publishing
This year the PXI Systems Alliance really went all out for the 10th annivesary of the PXI specification.
Test and Measurement   
The road ahead: Unit Under Test
By Don Dingee, OpenSystems Publishing
Let's set the record straight on why we're changing, and what our readers will see starting in 2008.
PXI Express   Summer 2007
Using PXI Express to shorten time to market for consumer electronics
By John Hottenroth, National Instruments
LXI   Summer 2007
LXI for obvious – and not so obvious – reasons
By Joe Engler, Intepro America
Test and Measurement   Summer 2007
Fiber-optically isolated instrumentation for pulsed power system diagnostics
By Benjamin Grady and Frank Peterkin, Naval Surface Warfare Center, Dahlgren Division
Consortia   Summer 2007
PXISA Technical Committee Update
By Mark Wetzel, Eric Gardiner, and Spencer Stock, PXISA Technical Committee
Test and Measurement   Spring 2007
A healthy option for test
By Nigel Adams, Aeroflex
Comprehensive test for medical devices, with a combination of analog and digital capability for in-circuit and functional test, calls for a unique set of hardware and software. As seen in this application, new PXI systems are coming to market, mixing several capabilities into a single platform.
Data logging   Spring 2007
Intelligent data logging streamlines operations
By Terry Nagy, Computer Aided Solutions
Modern data loggers can do much more than simply record analog and digital signals as did previous generations of these devices. Enhanced processing power combined with predefined math, statistical and alarm functions, and flexible programming interfaces, allow them to process measured data locally, reduce the volume of data being stored, and generate actionable information.
Replacing legacy equipment   Spring 2007
Replacing legacy equipment platforms with PXI for sound and vibration
By Wyatt Meek and Raj Balsamy, VI Engineering
With the ease of use of LabVIEW and the continued growth of new PXI modular instruments and data acquisition cards, engineers are able to easily replace legacy and proprietary instruments that cost their companies hundreds of thousands of dollars in support and data processing time with a single, open system.
ESD   Spring 2007
Electrostatic discharge testing: High voltage, high pin-count testing of semiconductor components
By Dr. Brenda McCaffrey, White Mountain Labs
ESD is a very costly and complex facet of the semiconductor industry, and there are many people involved in designing ESD protection strategies on monolithic ICs. These devices are characterized and tested to make sure that minimal levels of ESD immunity are sustained on today’s complex and highly integrated semiconductor products.
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