PXI Test and Technology
Fri, 16 May 2008
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Electrostatic discharge testing
High voltage, high pin-count testing of semiconductor components
By Dr. Brenda McCaffrey, White Mountain Labs

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PXI: Happy Birthday to a mainstream platform (PDF)
The most significant progress in the acceptance of PXI as a mainstream platform occurred in the past year when Agilent and Keithley, two cornerstones in the test and measurement industry, joined the PXISA.08/29/2007
PXI   Winter 2007
3U PXI packs a punch
By Staff, OpenSystems Publishing
3U PXI lends itself to small systems where rack space is limited or portability is desired.
Automated Test Systems   Winter 2007
An off-the-shelf test software platform for integrating multiple technologies
By Mike Dewey and Ron Yazma, Geotest
ATE systems are rarely all one flavor – they typically have a range of hardware and software technologies, and new technologies continue to be added all the time.
RF Test   Winter 2007
PXI gets serious for RF and optical test
By Staff, OpenSystems Publishing
Improved isolation and shielding techniques have led to a leap in RF technology on PXI formats.
Medical applications   Winter 2007
Developments in data acquisition aid in earlier cancer detection
By Staff, OpenSystems Publishing
A PET scanner system using a PCI digitizer effectively captures and measures data to produce precise 3D images of functional processes of the body.
RF Test   Winter 2007
Big system for big test
By Don Dingee, OpenSystems Publishing
Some complex testing requirements call for big systems to perform all the required at-speed testing.
PXI   
Celebrating milestones
By Bob Stasonis, OpenSystems Publishing
This year the PXI Systems Alliance really went all out for the 10th annivesary of the PXI specification.
Test and Measurement   
The road ahead: Unit Under Test
By Don Dingee, OpenSystems Publishing
Let's set the record straight on why we're changing, and what our readers will see starting in 2008.


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